Chip Detection
for Bottles and Jars
with X-ray Inspection

Many chip and finish defects can’t be identified by traditional vision systems. Learn how X-ray inspection systems can reliably detect chips and flaws in glass container finish areas.

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Fill out the form below to schedule a demo with Peco InspX.

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Detecting and Diverting Flawed Containers Improves Production:

  • Reduces breakages in the filler and capper
  • Improves proper container closure
  • Minimizes consumer risk of injury
  • Accelerates identification of compromised batches of containers
  • Reduces product loss

Learn more about how Peco InspX X-ray systems can identify flawed bottles and jars with a completely non-contact inline solution – inspecting at full production speeds.

Want to Learn More?

Fill out the form below to schedule a demo with Peco InspX.

Name(Required)
This field is for validation purposes and should be left unchanged.
or Call +1 800-732-6285